Review on the thickness measurement of ultrathin oxide films by mutual calibration method

Mutual calibration was suggested as a method to determine the absolute thickness of ultrathin oxide films. It was motivated from the large offset values in the reported thicknesses in the Consultative Committee for Amount of Substance (CCQM) pilot study P-38 for the thickness measurement of SiO₂ films on Si(100) and Si(111) substrates in 2004. Large offset values from 0.5 to 1.0 nm were reported in the thicknesses by ellipsometry, X-ray reflectometry (XRR), medium-energy ion scattering spectrometry (MEIS), Rutherford backscattering spectroscopy (RBS), nuclear reaction analysis (NRA), and transmission electron microscopy (TEM). However, the offset value for the thicknesses by X-ray photoelectron spectroscopy (XPS) was close to zero (−0.013 nm). From these results, the mutual calibration method was reported for the thickness measurement of SiO₂ films on Si(100) by combination of TEM and XPS. The mutual calibration method has been applied for the thickness measurements of hetero oxide films such as Al₂O₃ and HfO₂. Recently, the effect of surface contamination was reported to be critical to the thickness measurement of HfO₂ films by XPS. On the other hand, MEIS was proved to be a powerful zero offset method which is not affected by the surface contamination. As a result, the reference thicknesses in the CCQM pilot study P-190 for the thickness measurement of HfO₂ films on Si(100) substrate were determined by mutual calibration method from the average XRR data and MEIS analysis. Conclusively, the thicknesses of ultrathin oxide films can be traceably certified by mutual calibration method and most thickness measurement methods can be calibrated from the certified thicknesses.     

Vitamin D Inhibits the Early Aggregation of α-Synuclein and Modulates Exocytosis Revealed by Electrochemical Measurements

Alpha-synuclein (α-Syn) localizes at presynaptic terminal and modulates synaptic functions. Increasing evidence demonstrate that α-Syn oligomers, forming at the early of aggregation, are cytotoxic and is thus related to brain neurodegenerative diseases. Herein, we find that vitamin D (VD) can reduce neurocytotoxicity. The reduced neurocytotoxicity might be attributed to the less amount of large-sized α-Syn oligomers inhibited by VD, measured by electrochemical collision at single particle level, which are not observable with traditionally ensembled method. Single-cell amperometry (SCA) results show that VD can recover the amount of neurotransmitter release during exocytosis induced by α-Syn oligomers, further verifying the neuroprotection of VD. Our study reveals the neuroprotective role of VD through inhibiting α-Syn aggregation, which is envisioned to be of great importance in treatment and prevention of the neurodegenerative diseases.     

基于创新能力培养的化学专业本科实验教学新体系的构建与实践

课程体系是人才培养的载体。为了更好地培养拔尖创新人才,南京大学化学国家级实验教学示范中心依据化学学科的特点和发展趋势,以科学内容的内在联系和研究规律为主线构建了“化学实验基础?化学合成与表征+化学原理与测量?化学功能分子实验+化学生物学综合实验+基于项目的研究实验”实验课程新体系,按照一流课程建设要求(高阶性、创新性和挑战度)对实验教学内容进行了优化,并建立起与之相适应的实验教学平台。新课程体系综合考虑了化学一级学科的整体性和关联学科的交叉性,在南京大学化学化工学院“拔尖计划”和“强基计划”学生中实施,教学效果显著。     

圆平板挤压膜实验及其参数识别

完成了简谐激励下水中平行圆板的挤压膜振动实验．用最小二乘法识别出非线性粘性挤压膜力模型中的４个系数．不同挤压膜厚、不同频率和不同振幅情况的数值模拟结果与实验值吻合较好．研究结果表明，所用模型可较好地描述粘性挤压膜运动，识别出的系数在一定范围内给出良好精度的数值模拟．     

三轴转台轴系相交度误差测量方法的研究

—本文提出了一种新的轴系相交度误差测试方法。该方法不存在测量基准安装偏心问题，更适合于大型转台轴系相交度误差的测量     

数字图象测量系统灵敏度分析

在目前常规图象分辨率基础上，对数字图象相关测量方法的灵敏度进行分析，给出了位移和应变测量的灵敏度，并讨论了影响灵敏度的有关因素，进而指出，数字图象测量系统特别适合于各种位移场的大变形场的定量测量，在配制了相应的光学观察仪器后。也基本适合一般变形场的测量。     

微电子机械系统中转速测量的光学方法

利用显微测量技术和CCD图像传感器的线性积分成像特性,将数字图像处理技术与时间积分成像技术用于微电子机械系统(MEMS)中的转速测量。只需分别摄取被测物体上的标志点在静止状态下的时间积分图像和运动状态下的时间积分图像,即可测得物体在该段曝光时间内的转速。该方法对实验设备及实验条件要求较宽松。实验表明该方法对微系统中近似匀速转动时转速的测量是完全可行的,且具有较高的精度。     

Plastic surface strain mapping of bent sheets by image correlation

A technique using a single CCD camera, a precision rotation/translation stage, a telecentric zoom lens, and digital image correlation software is described for measuring surface profiles and surface plastic strain distributions of a bent thin sheet. The measurement principles, based on both parallel and pinhole perspective projections, are outlined and the relevant mathematical equations for computing the profiles and displacement fields on a curved surface are presented. The typical optical setup as well as the experimental measurement and digital image correlation analysis procedure are described. The maximum errors in the in-plane and out-of-plane coordinates or displacements are about ±5 and ±25 μm, respectively, and the maximum errors in surface strain mapping are about 0.1% or less based on a series of evaluation tests on flat and curved sample surfaces over a physical field of view of 15.2 × 11.4 mm². As an application example, the shape and surface plastic strain distribution example, the shape and surface plastic strain distributions around a bent apex of a flat 2 mm thick automotive aluminum AA5182-O sheet, which underwent a 90° bend with three bend ratios of 2t, 1t, and 0.6t, are determined using the proposed technique.     

无损残余应力测量及其新技术

简述及比较了主要的残余应力无损测量技术，重点为磁力法，并介绍一台新的磁力仪MAPS，且对MAPS及传统磁力仪作了比较，同时以X射线及中子衍射得到的结果验证了MAPS的可靠性，也介绍了文献上较少见的火车钢轨残余应力分布图。     

Strain analysis for moiré interferometry using the two-dimensional continuous wavelet transform

In this paper, we introduce the two-dimensional continuous wavelet transform for the automated strain analysis of the moiré interference fringe pattern. The Fourier transform method has been widely used for automated analysis of an optical interference fringe pattern. However, this method is hardly applicable to the analysis of the fringe pattern, which includes large displacement range or discontinuities. We show the advantages of the wavelet transform method by applying it to experimental results on composite laminates.